Sentence examples for diode test from inspiring English sources

Figure 5 Electron (left column) and hole (right column) current densities of Diode test case at (pmb{V_{mathrm{body}}=0.8 mbox { V}}).

Figure 2 illustrates the I-V characteristics of the diode test structures fabricated in carbon-implanted Cz and FZ silicon as well as a separate FZ sample implanted both with carbon and oxygen ions.

A right-pointing arrow with a cross through it marks the "diode test," for testing whether one-way electrical circuits are connected.[4].

We report on the design, manufacturing and first characterisation of pad diodes, test structures and microstrip detectors processed with high resistivity magnetic Czochralski (MCz) p- and n-type Si.

Each RAM memory has its own internal control logic which can address data in the operating clock cycle, with its own antenna diode protection, testing mechanisms, power rings, etc.

The experimental data gathered all along the 4000 h of stress accumulated up to now suggest the presence of multiple degradation mechanisms that may limit the useful lifespan of the light-emitting diodes under test.

The charged-particle response characteristics of these diodes were tested with 238Pu, 242Pu and 148Gd alpha-particle sources in air.

Efficiency of salad production under light-emitting diodes was tested with a prototype space plant growth facility "Phytocycle SD" with a 10-step crop conveyer.

The concept of a passive hybrid system consisting of fuel cell stacks, Li-ion battery packs, and two diodes was tested.

In addition, GaN p-i-n diodes were tested under an electron-beam in order to simulate common beta radiation sources ranging from that of 3H (5.6 keV average) to 63Ni (17 keV average).

He-Ne laser (632.8 nm) belongs to the most common devices used in LLLT, so we decided to test diode laser which produced radiation at 635 nm, comparable to He-Ne laser radiation.