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Zooming into the background of the diffraction spectrum (Fig. 5, bottom) reveals InN peak, diffracted by the sloped sides of the tip, as well as InN and InN and a peak of InN (and a weaker InN ) which are likely to originate from a small percentage of uprooted rods laying on their side.
Figure 9 Optimized diffraction spectrum.
Figure 4 X-ray diffraction spectrum of ZnO nanowires.
The diffraction spectrum image was collected by a 12-bit digital area array monochrome CCD.
From the X-ray diffraction spectrum, the formations of SnO2 NPs are confirmed (Fig. 2).
Figure 5a shows the X-ray diffraction spectrum of the N26 gray powder.
Fig. 2 X-ray diffraction spectrum of diamond grown for 12 h.
Figure 2 X-ray diffraction spectrum (a) and AFM image (b) of the GaN epitaxial layer.
The diffraction spectrum for each sample was recorded for 28 s.
Inset shows the X-ray diffraction spectrum of the sample in the Bragg configuration.
The measured reflected visible light diffraction spectrum is shown in Figure 5.
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