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The PCTTPD and PCTTTPD devices suffered from electron hole recombination at the polymer/PC71BM interfaces because of the insufficient energy offset between the HOMOs of the polymer and PC71BM.
The bending tests were performed using a home-made bending machine, and the memory characteristics were measured after the devices suffered from the bending cycles consisting of tensile strained and unstrained states.
The Garmin Forerunner 15, an entry-level watch, had a terrible time locking in while other watches like the Nike+ Sports Watch and Polar devices suffered from the same problem.
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But thin-film devices suffer from lower efficiencies.
Already demonstrated GNR-based devicesufferer from very-low currents and mobilities7,8,9,10,11,12.
The devices suffer from high series resistance and exhibit reduced fill factors.
Most electronic devices suffer from impact-induced failure in their usage.
These sensing devices suffer from their scarce capabilities, such as bandwidth, storage, CPU, battery power (or energy), sensing, and communication.
Due to the nonlinear operation, these devices suffer from high power that causes problems in very large-scale optical integration.
However, practical realizations remain inefficient as these devices suffer from an inherent difficulty in the extraction of photo-generated carriers from the confined states.
In general, these electrode devices suffer from reliability and variability issues, which have led to comparative studies of existing and emerging electrode designs to optimize performance.
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Justyna Jupowicz-Kozak
CEO of Professional Science Editing for Scientists @ prosciediting.com