We incubated D24 devices in a solution containing bovine serum albumin (BSA) in a 10−16 M concentration, with a relative abundance of 1 mg of D24 devices in 1 ml of solution.
The dopant-free CzPAF-TPA-based device displayed significantly improved device performance in solution-processed flexible i-PSCs and flexible BHJ IOSCs with power conversion efficiencies (PCEs) of 12.46% and 7.52%, respectively, with negligible hysteresis, which is superior to that of standard HTM.
This novel fluorescent material may be used as a fluorescent device in aqueous solution for the detection of Hg2+.
Electrochemical Studies: CV spectra were recorded with a Gamry Reference 600 device in CH3CN solution (Bu4NBF4 0.06 m) of the respective substance under argon.
The troughs were filled with lipids by immersing the test device in a solution of liposomes, 1,2-dihexadecanoyl sn-glycero-3-phosphocholine [PC 16:0/16:0)], and cholesterol (Avanti Polar Lipids, USA), followed by multiple washes to remove lipids deposited on the PEG.
Do not immerse the device in the solution unless you can detach the battery holder entirely from the rest of the device to do so.
This desalted peptide mixture was then fractionated in 10 fractions by isoelectrofocusing using a Microrotofor device (Biorad), on an in-solution pH gradient from pH 3 to pH 10.
Our experiments provide a feasible application of La2O3 in organic electronic devices with solution process.
These polymeric thin film devices may be processed in solution at lower temperatures compared to their inorganic counterparts, and can be readily deposited using a low-cost casting method.
A good correlation between the metal concentration directly measured and the concentration estimated with the help of the DGT equation was obtained using this device in synthetic solutions (10 μg L−1 Cd, 0.01 M NaNO3, pH 6).
With the continuous development of integrated circuit, high-k materials have been extensively studied to substitute traditional SiO2 gate dielectrics in CMOS devices as a solution for the saturation of the leakage current and power consumption [1 3].
