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The relationship between device voltage and carrier lifetime is established.
The high-resistance transparent (HRT) or "buffer" layer has been used extensively in CdTe thin-film photovoltaics to enable a reduction in CdS thickness while maintaining near-maximum device voltage and fill factor.
Such local modifications are due to possible various extrinsic causes (manufacturing, operational or environmental) and are shown to have a critical influence on the device voltage blocking capability and reliability.
Moreover, the extended potential window of the MnO2 cathode can effectively increase the device voltage of the as-assembled ASC up to 2.3 V, resulting in significantly increased energy density.
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Fuel cell device voltages ranging from 1 V single cells to 16 V planar arrays were demonstrated, with power output ranging from <1 to >200 W.
To investigate the device-to-device variability of fabricated devices, set voltage and resistance distribution of 10 randomly chosen RRAM devices in a crossbar array was tested.
device total voltage.
a Reflection spectra of the device at voltage bias = 0, 3, 6 and 9 V.
Normally, a faulty cipher text is taken by giving external impact on a device with voltage variation, glitch, laser, etc.
To deal with large scale power systems, an additional device called voltage measuring unit (VMU) is introduced in [22, 23] to overcome the data quality issue of PMUs.
This study identifies the process modules that impact directly the effective work function from those that only affect the device threshold voltage, due to the device architecture.
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