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Our device sits between the mains line and the device under test.
Finally, experimental results are presented demonstrating failure detection and protection of the device under test.
by means of thermal chambers and shakers which stimulate the device under test with external stresses.
Device under test is positioned within the region of uniform EM field.
Another device under test is a bulk distributed Bragg reflector laser exhibiting 3 lasing modes.
It allows to calculate the TLP response curves of the device under test.
The impedance analyzer is able to measure the complex impedance of any device under test (DUT) for a range of signal frequencies from 500-2000 Hz.
The user will be able to insert the device between the wall socket and the device under test (DUT) to measure the amount of AC power being used.
In a white box model, the test is aware of the inner workings of the device under test.
In addition, the method says whether the performance of the device under test differs significantly from what would be expected.
Moreover, the simulation environment supports not only the device under test, but also the test stimulus generation and checking.
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