In our previous contributions [R. Mroczka, G. Żukociński, A. Kuczumow, J. Alloys Compd. 362 (2004 88 955; R. Mroczka, G. Żukociński, A. Kuczumow, Geometrical description of the X-ray capillary and total reflection mirror surfaces with assumed reflection features, J. Alloys Compd. 382 (2004) 311 319], we solved the problem of analytical description of capillaries with designed reflection features.
It was a hagiography, not designed for reflection or even to embed Lynn properly in her musical or historical context.
"It's designed for reflection and introspection, which lead to an understanding that there would be no universe without divine existence".
But on a day designed for reflection and celebration, I hope you, too, find encouragement in her example and her words.
Beyond our particular case study, we suggest that the framework and associated methodological approach for rating reflection is of value to those within the HCI community interested in designing for reflection on experience.
This chapter is based on the description and analysis of a case study in designing collaborative reflection support conducted together with a German neurological hospital.
Then, the method of combining with MIST scattering calculation software and geometric modeling was firstly used to design spherical reflection system, on the basis of the formula of object-image distance.
In principle, an anti-reflection (AR) coating could be designed to minimize reflection loss at the input interface, but fiber index matching fluid would still be used to fill-in the air gap.
They also supported two experiential methods of design reflection-in-action enactment and immereflection-in-action enactmentnding designereflection-in-action enactmentific interandimmersion thatthe were in their own sensing, feeling and movitalbodies.
The gray-tone mask design, reflection-type projection photolithography setup, enzyme etching processing, and the characterization of fabricated 11 × 11 gelatin microlens array, are presented in this paper.
As a preliminary test of the apparatus, the reflection profile of a Mo/SiO2 multilayer mirror prepared by an ion beam sputtering technique, which is designed as a reflection polarizer for use of 13.9 nm, has been measured by the apparatus.
