Sentence examples for describing low from inspiring English sources

Also, the profile showing a singular strength in reading is most commonly found among the profiles describing low achievers.

For the high achievers, in 71%% of all profiles, a strength in science becomes apparent, but only for 31%% of the profiles describing low achievement.

Most people in KGR go on migration for 3 months of the dry season, searching for the crop residues of indigene farmers and fadama [Hausa word describing low lying well-watered land] areas for grazing.

Conclusions: These results confirm those of our earlier study describing low replication ability of 8-bp deletion mutant HBV in vitro, and also indicate that the presence of genotype B correlates with reduced titer of HBV.

A comparison of codes between profiles shows that more than two thirds of all profiles describing high and excellent achievement across the subjects (profiles 6 and 7; 74 %) but only about half of the profiles describing low achievement (profiles 1 3; 47 %) show a relative strength in science and/or reading (SRM, RS, R, S, RSM).

To date, flicker noise (1/f) compact models for describing low frequency noise performance of the n-channel transistor in DNW architecture under varying secondary body bias is lacking, since the current BSIM noise model only caters for the standard MOSFET which do not have the DNW.

That is, users will be freed from the complicated and tedious task of describing low-level details and repeating routine activities.

Physical, chemical and electrical linkage among modules describing low-temperature plasma structure/function in a reactor, the profile and local charging evolution in a hole/trench, and electrical device damage during etching will make it possible to prepare a technology computer aided design (TCAD) for the practical purpose of prediction and design of the etching process.

Physical, chemical and electrical linkage among modules describing low-temperature plasma structure/function in a reactor, the profile and local charging evolution in a hole/trench and electrical device damage during etching will make it possible to prepare a technology computer-aided design (CAD) for the practical purpose of prediction and designing the etching process.

The allele-frequency method may therefore be better for the purpose of describing low-risk UVs than high-risk UVs.

Using inadvertent intrathecal administration of vinca alkaloids as an example, we investigated whether analysis of incident report data describing low-harm events could bridge this gap.