Sentence examples for depth side from inspiring English sources

On the vinyl release — recommended for this album's depth — Side 1 sounds antiquarian and Side 2 experimental.

We measured five variables: gill height and gill depth (side view), gill width (top view), distance between the three gill rachises (front view) and the length of the second gill rachis (top and front views) (illustrated in Figure. 4).

The proposed connection contains a pair of full-depth side plates to connect the beam to the column.

The campaign documentary Mitt is interesting because it shows a more in-depth side of Romney than was seen by most people during his campaign.

In their paper, Singh and Rose discuss the points 1 3 in depth, always side by side with the well-being of families and children, their rights and against those who might make decisions on their behalf and their costs.

The critical dimensions used in the simulation, including the periodicity (P), depth (D), side length (L), and the separation between side edges in two adjacent INPs (S) were denoted in Fig. 2a with L ~ 0.7P and S = P – L.

The dependence of the transmitted coefficients and motion responses on the design parameters, such as porosity and protruding depth of side plates, is systematically analyzed.

It is concluded that both properly selected porosity and deeper protruding depth of side plates are helpful in reducing the transmission coefficients and also extending the wider applicable extent of incident wavelength for performance enhancement.

This study has demonstrated the potential of cryogenic forming by manufacturing a B-pillar part with 8 mm depth of side design element as compared to 6 mm at room temperature.

It is noticed that at 0° wind incidence angle, pressure distribution and magnitude of pressure coefficients on windward wall of square/rectangular models are almost independent of the model depth and side ratio.

Open image in new window Fig. 5 SEM images and Raman spectra of CNT patterns: a without secondary etching; b with secondary etching of 0.5 nm depth; c side view with secondary etching of 0.5 nm depth; d TEM image of a CNT array grown under the optimized FIB processing conditions shown in c.