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(b) Depth profiling analysis of the composite system.
Coating thicknesses were measured using Auger electron sputter depth profiling.
The 'interfaces' were additionally characterized by AES depth profiling.
Dopant depth profiling was accomplished by Rutherford backscattering spectrometry (RBS).
Marinova, M. et al. Depth profiling charge accumulation from a ferroelectric into a doped mott insulator.
Marinova, M. et al. Depth profiling charge accumulation from a ferroelectric into a doped Mott insulator.
Depth profiling was achieved with the aid of Auger electron spectroscopy.
Sputter depth profiling of the composite confirmed a homogeneous mixing of nanoparticulate CdSe and f-MWCNTs.
GDOES sputtering was used for elemental depth profiling of the coating.
The nanostructured films are analysed by means of XPS and sputter depth profiling.
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For Al diffusion measurements in-depth profiling by secondary ion mass spectrometry is applied.
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