Sentence examples for depth characterized from inspiring English sources

Furthermore, he stated that he had the "surprising depth" characterized by past Final Fantasy protagonists, and called the ending involving Tidus "emotionally charged and satisfying".

Haplogroup D has a likely pre-LGM time depth characterized by an overall coalescence time estimate of 35 37 kya, depending on the mutation rate used.

The results show that in the co-linear/co-elliptical channels the imaging depth, characterized by image contrast, has a linear relation with the degrees of ellipticity.

In the present work, various tungsten carbides and iron-nitrogen modified tungsten carbides catalysts are synthesized and in-depth characterized through various physical and electrochemical techniques towards gaining insights on the ORR process on these materials in both acidic and alkaline media.

The synthesized materials were in-depth characterized with a multi-technique approach and the electrochemical performances were correlated i) to an effective reduction of the GO oxidized moieties and ii) to the maintenance of the 2D geometry of the final graphenic structure observed.

Such shallow indentation depths characterize more the surface and near surface properties rather than the bulk ones [7]; (b) the shallow indentation depths are strongly affected by specimen roughness, and thus, the accuracy of experimental results are sensitive to the specimen roughness state [10].

With the high efficiency, high sensitivity, and high throughput properties associated with NGS, scientists are now capable of in-depth characterizing the components of the intestinal microbiome.

Since CNVs play a vital role in genomic studies, and pigs act as one of the most economically important livestock worldwide as well as popular model for various human diseases [ 44], it is an imperative need to develop a comprehensive, more accurate and higher resolution porcine CNV map and in-depth characterize CNVs across pig genomes for follow-up CNV functional investigation.

The results of stress inversions also indicate that the stress field varies with depth: shallower depths are characterized by N S tension and E W compression, while greater depths are subjected to E W compression and vertical tension.

The Cu diffusion depth was characterized with the secondary ion mass spectrometry (SIMS) technique.

Film composition depth profiles characterized by secondary ion mass spectrometer (SIMS) indicate uneven fluorine distribution within SiOF film after precipitation.