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The system collects three simultaneous images: a deflection image, a topographic image, and a force image.
(a) Deflection image, (b) friction force image, and (c) cross-section lines performed as shown in (a) and (b).
(a) AFM deflection image in aqueous solution revealing rodlets on the surface of an Aspergillus fumigatus spore.
From the deflection image, as shown in Figure 2a, rhomb-shaped areas can be found on the surface.
Inset: an illustration of the force spectroscopy mode; a grid has been set over the cell nucleus (CaSki cells, deflection image).
3D reconstruction of the AFM height image of the side of a cell, with the corresponding deflection image and height cross section along the indicated red line.
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Images show 3D reconstructions of AFM height images (not shown) with the corresponding deflection images.
Representative 3D images and deflection images are shown in Figure 4.
Representative AFM deflection images of DPSC on pSi (A) and flat Si (B).
Images show 3D reconstructions of AFM height images (not shown) with the corresponding deflection images and height profiles of the cell body along the indicated red lines.
Figure 4a,b displays two- and three-dimensional (deflection) images of the wear scar, respectively, at ISL. Figure 4c,dc,d shows the images at 2.5 s SDL, while Figure 4e,f exhibits the images just before weld load (JBWL).
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