The term "defective chip" is correct and usable in written English.
For example, "The quality assurance review identified a defective chip that needed to be replaced."
Replacing the defective chips may cost up to $4 million, the company said.
Intel can make fewer chips per wafer of silicon, and the larger size creates more defective chips.
One of the most important tasks in VLSI testing is to minimize the number of defective chips shipped to customers.
Its probe cards are designed to reduce manufacturing costs of complex, high-speed chips by identifying defective chips early and by testing multiple chips at once.
The more transistors on a chip, the more likely it will get a few bad transistors, and therefore a few defective chips, he says.
The RDRAM chips themselves are larger, and therefore costlier, than the conventional SDRAM memory typically found in today's PCs, and manufacturing yields (the number of functioning chips versus defective chips) for RDRAM chips tend to be lower than for SDRAM, making the entire prospect of manufacturing Rambus memory an overall painful prospect.
The wafer-level test is the first step in the device manufacturing process, where chips fabricated on a bare wafer are subjected to standardized tests by using the input/output (I/O) terminals of the chips in order to determine defective chips before the packaging process [3].
That false alarm was the fault of a defective computer chip that cost forty-six cents.
An investigation later found that a defective computer chip in a communications device at NORAD headquarters had generated the erroneous warning.
