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Our exploratory analysis was designed to see if there were specific malformations of concern; we found single ventricle and atrioventricular septal defect to represent a higher proportion than expected (though this might be a chance finding associated with multiple comparisons).
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Introduction of a single linear misfit compensating defect is concluded to represent the most useful definition of the transition between fully and partly coherent interfaces.
Moreover, because there is a reduction in the earliest muscle contractions at the outset of spontaneous coiling, the defect is likely to represent a structural or functional abnormality rather than a progressive breakdown of muscle integrity.
This should indicate that the minimum angle alone, as in the case of orthogonality defect, is not sufficient to represent the quality of a reduced basis or a reduction method, unless the lengths of the original basis are already short.
Dimension reduction procedure is the recipe to represent defects in two dimensional dislocation dynamics according to the changes in the geometrical properties of the defects triggered by different conditions such as radiation, high temperature, or pressure.
The corneal endothelial dystrophies comprising Fuchs endothelial corneal dystrophy (FECD; MIM s 136800 and 610158), posterior polymorphous corneal dystrophy (PPCD; MIM s 122000, 609140 and 609141) and congenital hereditary endothelial dystrophy (CHED; MIM121700 and 217700) are thought to represent defects of neural crest terminal differentiation [ 1].
Such spots do not appear to represent defects in the manufacturing of the array filter at which no DNA was deposited, because at the end of the experiment, we looked for DNA in those spots directly by staining them with the fluorescent nucleic acid dye acridine orange, followed by imaging of the spots with a fluorimager.
For the internal validity of this experiment, it is often difficult to represent a defect at a high abstract level since a code defect may refer to detailed contents.
In order to represent the defect structures clearly in these two figures, the fcc atoms are eliminated.
In this paper we report progress at the College of Nanoscale Science and Engineering CNSEE) in Albany, New York, to print and process advanced defect metrology test structures intended to represent a 13 nm gate length.
A conventional FCC cell [20], constituted by 104 (Fe and Ni) metal atoms (50 50) distributed in five close-packed FCC (111) planes, was used to represent the defect and its environment.
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