Fig. 2 Constituent analysis of the fabricated NiO nanopetals using XPS a survey scan, b deep scan of 2p Ni, c XRD for the structural analysis, and d surface area and textual study using BET isotherm measurement by N2 adsorption/desorption.
This is a deep scan of both the material of wood and the time embedded in its structure".
The illumination of the specimen provided by the SP2 confocal laser scanning microscope used in this study was restricted to a single point (~ 0.25 μm in diameter by ~ 0.5 μm deep), scanned across the specimen.
Select Deep Scan: Select deep Scan method for optimum result.
If given the option, perform a Full or Deep scan instead of a Quick scan.
Some programs will give you the option to perform a deep scan while looking for files.
In the Deep Scan method, documents will be listed according to file type and category.
Deep scan process is time consuming so use this process when database is small size.
you will be asked whether to perform a deep scan or raw file recovery to get your data back.
a) Quick Scan b) Deep Scan c) Range Based Scan Select Corrupt BKF File: Select BKF corrupt file to repair it.
