The effects of specific energy, pulse voltage, cumulative discharges, feed particle size and ore particle breakage pattern (body breakage or surface breakage) were investigated.
Fig. 5 Cumulative density distribution of voltage instability for correlation κ = 0.162 Fig. 6 Cumulative density distribution of voltage instability for correlation κ = 0.257.
Figure 6 Cumulative probability of formation voltage and leakage current.
Fig. 3 Cumulative density distribution of voltage instability with critical power.
For correlation coefficient κ = 0.280 and κ = 0.794, the cumulative density distributions of voltage instability are expressed in Figs. 8 and 9, respectively.
Figure 5 Cumulative probability of SET voltages for the S1 and S2 devices.
Figure 5 Cumulative probability of leakage current, formation voltage, SET/RESET voltage, and RESET currents.
The cumulative distributions in the breakdown voltage are near-normal, which are consistent with the PDM, assuming the distributions of potential breakdown sites in terms of the cation vacancy diffusivity for different concentrations of chloride are normal.
Photon shot noise was the dominant source of noise in the optical trace: the cumulative photon count at resting voltage was only 4500 photons per 100 µs sample.
Fig. 2 a The cumulative probability of the set voltages of ZnO Fe-0T and ZnO Fe-0TP films.
