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For SAXS measurements, a focusing mirror for Cu radiation was used.
X-ray powder diffraction (XRD) experiments were carried out with Cu radiation (MMA007, manufactured by GBC Australia).
Cu radiation (λ = 1.54 Å) was scanned over diffraction angle (2θ°) of 5-50° with a step of 0.01°.
For SAXS measurements, the scan range was from −0.12° to 5.01° with a 0.01° step size and it utilized a parallel beam X-ray mirror for Cu radiation.
Intensity data were collected, using Cu radiation (V) or Mo radiation (VI), on an Oxford Diffraction Gemini-R Ultra diffractometer operated by the CrysAlis software [56].
The crystalline structure and preferential orientation of the films were characterized using the θ − 2θ scan by Rigaku X-ray diffraction (XRD) with a Cu radiation.
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XRD were measured on a Philips X'Pert Pro Super X-ray diffractometer equipped with graphite-monochromatized Cu Ka radiation.
XRD patterns of the samples were obtained on a diffractometer (Rigaku D/max 2500/PC) using Cu Kα radiation.
The X-ray diffraction patterns (XRD) were measured on a Philips X'Pert Pro Super X-ray diffractometer equipped with graphite-monochromatized Cu KR radiation.
Note that the other major Rietveld programs use a slightly different value for Cu Kα radiation as default.
The XRD and reflectivity measurements were performed using a Bruker D8 Discover system with Cu Kα radiation (λ = 1.5406 Å).
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