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Atomic force microscopy (AFM) image and the corresponding cross sectional height profile are reported in Figure 1).
Cross sectional height profiles of a single Ga droplet and concentric triple quantum ring (c) Figure 2 Pholuminescence spectra of CTQRs recorded at 15 K. GaAs and Al0.3Ga0.7As peaks appeared at 1.52 and 1.90 eV, respectively.
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To perform semi-automatic discrimination between the round and distorted closed rings, we used the standard deviation of cross-sectional height variations (SDCH) measured along the top surface of the ring (Supplementary Figure 11).
To evaluate corrugations of the cross-sectional top surface profile of TClpB oligomers and discriminate between round and distorted closed rings, we used the standard deviation of cross-sectional height variations (SDCH).
Five groups of geometrically similar RC beams with cross-sectional height ranging from 200 mm to 1000 mm and a shear-span ratio of 2 were designed and tested.
(c) The STM cross-sectional height profile along the white line.
Figure 3 shows the typical AFM image and the corresponding cross-sectional height curve of ZnO nanosheets.
Fig. 3 a Typical AFM image and b corresponding cross-sectional height curve of P-doped ZnO nanosheets.
a Topological, in which the blue line represents the AFM cross-sectional height data along the scanned red line.
Fig. 3 Cross-sectional height and width morphology measurements of the maxilla and mandible in the three groups (low-, normal- and high angle).
Fig. 1c shows the cross-sectional height profile for Sample A (black line) and B (red line) obtained from the AFM images.
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