Sentence examples for cross section scanning from inspiring English sources
Modification of SiO2 precipitate formation by defect engineering of SIMOX (separation by implanted oxygen) process was studied using cross section scanning spreading resistance microscopy (SSRM).
(a) High-resolution X-ray diffraction (HR-XRD) and (b) cross section scanning transmission electron microscopy (STEM) image of BiFeO3/La2/3Sr1/3MnO3 (BFO/LSMO) thin films on SrTiO3 (STO) substrates.
Fig. 2 Characteristics of FBAR based on c-axis ZnO film: a the cross section scanning electron microscopy image, the insert is the G-S-G G-S-G G-S-Gu electrode, b the ampatternedon of ZnO piezoelectric film, c the XRD pAutelectrodee device, and d the rocking curve of ZnO (002) peak.
Figure 1c shows a false-colored cross section scanning electron microscopy (SEM) image of the final TiO2/ p-InP heterojunction solar cell.
c Cross-section scanning electron microscopy (SEM) images of a meso-superstructured perovskite solar cell (scale bar is 500 nm) [22].
Optical microscopy of the cross-sections, scanning electron microscopy coupled with energy-dispersive X-ray analysis (SEM-EDX), X-ray diffraction as well as pyrolysis-gas chromatography mass spectrometry have been used to both characterise the inorganic pigments composition and the binding media used.
In Fig. 13 we show a cross-section scanning tunneling microscopy image of SML QD insertions in chemically sensitive conditions.
Characterization techniques included scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), and cross-section scanning transmission electron microscopy (STEM).
The cross-section scanning electron microscope (SEM) images provide a strong evidence of the formation and annihilation of the metallic filament.
Figure 1 presents the top view and cross-section scanning electron microscopic (SEM) images of Ag NRAs with thicknesses of 169, 198, and 269 nm, respectively.
Cross-section scanning electron microscope (SEM) observations of the films were conducted on a Hitachi S4800 field emission SEM at an accelerating voltage of 5 kV.
