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Fig. 3 Macroscopic differential scattering cross section plotted against the scattering vector Q (Å−1).
The cross section plotted in Figure 1b shows that the depth of the pit is 100 nm.
The cross section plotted in Figure 1f shows the spatial profile of electrical current inside the pit.
Cross sections plotted in Figure 2d,h, respectively, show that the pit depth is now 175 nm (FWHM is 200 nm) and that the conductive region exhibits an electrical current peak of 670 pA (FWHM is 30 nm). Figure 2 Local morphology images after FE-MISPC resulting in non-conductive pits.
The cross-section plot for topography image shows flat profile, with exception of few impurities.
The inset is the cross-section plot along the red line in the AFM image.
Figure 2b shows a surface potential map, obtained with KPFM and reveals a pronounced difference (20 mV) in surface potential on the border of two thiols (cross-section plot, Figure 2d).
Moreover, the vertical cross-section plot in Fig. 5(c) illustrates that the two reconstructed objects generated by L2 regularization are more distorted in their shape and also pulled toward the center.
Possible options discussed were the inclusion of a cross-section plot from the edges of a vesicular 2D crystal, the inclusion of subtomograms from such edges in the averaging procedure to decrease the effects of the missing wedge on the membrane region in the subtomogram average, recording dual-axis tomograms to 70°, or recording images on cryo-sections of crystals.
Their cross sections are plotted in (f, h), respectively.
Their cross sections are plotted in (b, d), respectively.
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Justyna Jupowicz-Kozak
CEO of Professional Science Editing for Scientists @ prosciediting.com