In 1959, Robertson compared a collection of cross-section pictures and observed that the whole railroad track was consistently observed in a variety of cells.
Surface and cross-sections pictures of the samples were taken using Scanning Electron Microscopy (SEM - model AMARY-18301).
The upper right picture shows a cross section image of light intensity distribution inside and outside a 5 μm fiber illuminated by 1.06 μm laser.
Fig. 2 a AFM image and b cross-section picture of nano-patterned Si structures.
Figure 1 SEM cross-section picture of NAA-based DBR sample obtained with Q 0 = 0.5 C, 50 cycles, and T anod = 9°C.
Figure 2b is the cross-section picture, which shows that the periodicity of nano-patterned structures is 300 nm and the depth is about 51 nm so that the aspect ratio defined as the ratio of depth (H) to diameter (D) (H/D) is less than unity.
Open image in new window Fig. 2 The cross-section SEM pictures of ITO thin film.
A few microscopic studies 1, 16 on TTCMs have been reported, however, only cursory hand-drawing pictures on cross section were provided and none of them showed detailed color illustrations of the characteristics of powder.
The cross-section SEM pictures of ITO films (S-A-2 and S-A-3 samples) are given in Fig. 2.
From this perspective, we developed Geolokit: a free and lightweight software that allows geoscientists – and every scientist working with spatial data – to import their data (e.g., sample collections, structural geology, cross-sections, field pictures, georeferenced maps), to handle and to transcribe them to Keyhole Markup Language (KML) files.
Figure 1 SEM picture of a sintered PSi cross section.
