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The cross section of samples and corrosion layers observed by SEM method are shown in Figures 2, 3, 4, 5 and 6.
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Fig. 1 HRSEM micrographs showing cross section of samples (a) prior to SiGe SEG growth, (b) poor Si surface clean, (c) good Si surface clean and SiGe growth.
(d) TEM cross section of sample b and (e) EDX mapping of sample b.
Figure 5 represents cross section of sample HT.49.04 and the layers in a SEM-BSE micrograph.
(a) Morphology and (b) cross section of sample A at 75°C and (c) morphology and (d) cross section of sample B at 60°C. Figure 3 shows AFM images of the TiO2 thin films with different precursor temperatures such as 75°C (sample A) and 60°C (sample B).
The aim of the study is to analyse the influence of variation of particular cross-sections of samples and their enlarged side surface on the hydraulic conductivity measurement.
In addition, SEM and X-ray images in the cross section of sample no.
(d) Cross section of sample shown in (b).
Fig. 4 Cross section of sample no.
Figure 6 represents analysis carried out on cross section of sample HT.50.04.
The cross section of sample E was observed at 200 kV by Tecnai G20 TEM system.
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