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The magnification is 5,000x for the surface and 1,200x for the cross section films.
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High-resolution transmission electron microscopy carried out on cross-section film samples prepared by a focused ion beam (FIB) technique revealed that the film ultrastructure was composed of columnar crystals oriented perpendicularly to the substrate surface.
The surface and cross-section film morphology was characterized by SEM Quanta 200 (FEI, USA) with a resolution of 3.5 nm at 30 kV.
Scanning electron microscopy (SEM) images of the surface and cross section of films were taken with a Leo Gemini 982 microscope.
In 1995, the Catholic Church's Pontifical Commission for Social Communications issued a list of 45 films representing a "cross section of outstanding films, chosen by a committee of twelve international movie scholars".
To confirm it, amplified SEM images of the cross section of TiO2 films have been obtained.
The cross section of the films changed from random porous to fine continuous column structure with duty cycle varied from 50%to80%0%.
c, d Top-view and cross section of NWs films.
Additionally, the cross section of sandwich films was measured by the FIB-SEM technique (Figure 8).
Auger map of Si distribution in the small angle cross section of multilayer film coating on B 2 specimen.
The inset shows the top view of the moment distribution of the cross section of the film and nanowires.
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