Sentence examples for correction of aberrations from inspiring English sources
More often a number of lenses made of different materials are combined together as a compound lens in a tube to permit the correction of aberrations.
An advantage of this approach is that, since the relayed image is at infinity, the microscope objective itself, a very lightweight component, can be moved to effect focusing without upsetting the correction of aberrations.
High-order transfer maps of particle systems play an important role in the design and optimization of particle optical systems, both for satisfying the basic design needs as well as for the correction of aberrations and non-linear effects, and the differential algebraic (DA) method has proved useful for this problem.
Frequently the design of schemes for correction of aberrations or the determination of possible operating ranges for beamlines and cells in synchrotrons exhibit multitudes of possibilities for their correction, usually appearing in disconnected regions of parameter space which cannot be directly qualified by analytical means.
Correction of aberrations would tend to reduce the effects of lag.
This may explain why we found no statistically significant effect of correction of aberrations on the percentage overshoot magnitude.
In the case of an average correction of aberration, this error can easily be reduced to a negligible value as the total number of photons required to achieve a Strehl ratio greater than 0.9 for 11 modes (or equivalently total residual aberration smaller than 0.325 rad rms; diffraction-limited performance is achieved for a Strehl ratio above 0.8) is only of the order of 10 − 10 photons.
It has been shown that accommodation can be stimulated by inducing monochromatic aberrations [ 4], and static correction of these aberrations has been shown to improve the steady-state accommodative level when fixating on a stationary target [ 5].
With the successful correction of lens aberrations, the STEM has become the dominant microscopy technique used today in material research, due to the availability of simultaneous, multiple, imaging and spectroscopic modes.
Scanning transmission electron microscopy (STEM) together with correction of geometric aberrations in the probe forming optics allows routine acquisition of atomic resolution images with sub-Å resolutions [1, 2].
We present two accurate and relatively simple interferometric methods for the correction of wavefront aberrations of about 3 wavelengths (3λ) in spatial light modulators (SLMs) of the liquid crystal on silicon (LCoS) type.
