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Inset shows a four-probe device used to measure contact resistance and resistivity.
Furthermore, the effect of edge-contacted structures on the contact resistance was examined.
Passi, V. et al. Contact resistance study of "edge-contacted" metal-graphene interfaces.
They provide advanced impact and electrical contact resistance.
and consequently reducing contact resistance between them.
Interfacial contact resistance (ICR) was also evaluated.
The contact resistance achieved was 600 mΩ.
This paper introduces an improved thermal contact resistance (TCR) model.
DC measurements exhibit a very low contact resistance (0.02 Ω).
Contact resistance was modeled analytically using Maxwellian spreading resistance theory.
Finally, the influence of metal semiconductor contact resistance was considered.
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