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One of such schemes is the duplication with comparison combined with concurrent error detection (DWC-CED) proposed in [28].
In order to provide reliable architecture for this algorithm, a concurrent error tolerant scheme forSHA-3 is used.
Concurrent error detection (CED) schemes are becoming essential features in the design process as IC technologies progress into the nanoscale era.
Our analytical results also show that the area overhead of the proposed digit-serial multiplier with concurrent error detection does not exceed 5%.
The use of a concurrent error detection (CED) scheme in order to achieve the high reliability requirement of modern computer systems is becoming an important design technique.
Four schemes for concurrent error detection are analyzed: duplication of a combinational logic, Berger codes, Bose-Lin codes, and parity-check codes.
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The variable Position accounted for 11.94% ± 2.22 of the variation and was also concurrent to error.
Under the heading "Total estimation error (concurrent estimator)" the output contains the sum of the two preceding errors.
Objective: To investigate the reliability, concurrent validity, and error of a new video digitizing system for evaluating posture when applied to inanimate objects.
It showed that the error in concurrent prediction of crack depth and its location using the proposed algorithm is about 10%.
The best performers were found to be (1) a MBFIPS ELM algorithm based on the concurrent minimization of an error function and the number of selected inputs, and (2) a BFIPS ELM algorithm based on the minimization of a variant of the Akaike Information Criterion AICC).
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