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Optical and electron micrographs characterize the surface details.
Scanning electron microscope (SEM) was used to characterize the surface morphology of the Ti implants.
Boehm titration technique was used to characterize the surface chemical property of the absorbent.
First, it is used to clean and electrochemically characterize the surface of the gold coated cantilever.
This was used to characterize the surface features of the Au-CSCaCO3NPs.
XPS study was performed to characterize the surface composition of pristine and irradiated GaAs samples.
ATR-FTIR and XPS were used to characterize the surface chemical composition.
These parameters respectively characterize the surface drag, wall heat and mass transfer rates.
Except the high requirement on the surface evenness, AFM technique can only characterize the surface morphology.
The samples were then sent to characterize the surface morphology and crystallographic structure of the TNTs.
These parameters respectively characterize the surface drag and wall heat transfer rate.
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