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A semiconductor characterization system is utilized to source dc bias and measure current.
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A standard four-probe Keithley 4200 semi conductor material characterization system was used for testing nanocomposites conductivity.
As to the electrical measurements, a low-noise Keithley 4200 semiconductor characterization system was conducted at room temperature, in voltage sweep mode.
The differential system characterization of hysteretic system is well known.
In order to model the physical system accurately, precise characterization of the system is essential.
The system has been shown to work well in a previous experimental study but detailed characterization of the system is missing.
(6.2) Another important characterization of the system is how the mean synaptic current responds to small external inputs.
The characterization of open system is fundamental in the study of systems due to the exchange of information flows, materials, energy, among others; between the system and its environment.
This is especially important in the mesoscopic scale where changing the groups, the characterization of the system is also changed.
Further characterization of the optical system is required to accurately apply such a correction.
A basic characterization of our refactored system is presented in Supplementary Methods.
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