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Characterization of the sample topology was performed by means of the scanning electron microscopy (SEM).
Thus, we performed AFM and SEM characterization of the sample S30/S20.
Characterization of the sample will be reported in a subsequent paper.
Raman spectroscopy and X-ray diffraction (XRD) are used for the structural characterization of the sample.
Differential scanning calorimetry is used to observe the thermal characterization of the sample.
The main drawback of marker tracking is that the markers will be present in the reconstruction and must be removed for accurate characterization of the sample.
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The structural characterization of the samples was characterized by X-ray diffraction (XRD) technique using a Philips X'pert X-Ray Diffractometer Model 7602 EA Almelo with Cu Kα radiation at 1.5418 Å.
Microstructural characterization of the samples was also characterized by XRD and TEM.
Summary of the morphological characterization of the samples.
Furthermore, the Raman characterization of the samples was performed.
Table 2 summarizes the results of the morphological characterization of the samples.
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characterization of the test
identification of the sample
characterization of the model
profile of the sample
qualification of the sample
interpretation of the sample
determination of the sample
qualifications of the sample
characterization of the specimen
characterization of the random
characterization of the case study
characterization of the specimens
characterization of the sampled
profiling of the sample
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