Sentence examples for cause of faults from inspiring English sources
Condition monitoring is a type of maintenance inspection where an operational asset is monitored and the data obtained is analyzed to detect signs of degradation, diagnose cause of faults, and predict for how long it can be safely or economically run.
However, induction motors manufacturers ensure that the machines present asymmetry as small as possible because it could be the main cause of faults [7].
We describe how to detect and diagnose the causes of faults for stochastic processes.
Although basic statistical analysis provides a general knowledge of the primary causes of faults; nevertheless, it falls short of describing nuanced conditions that lead to a fault.
Reasoning on this knowledge base by virtue of JESS (Java Expert Shell System) rule engine, maintenance personnel can find the causes of faults of a wind turbine quickly, and choose the proper solutions.
As one of the most important approaches for analyzing the mechanism of fault pervasion, fault root cause tracing is a powerful and useful tool for detecting the fundamental causes of faults so as to prevent any further propagation and amplification.
The results obtained from simulated and practical experiments prove that exact wavelet analysis not only minimizes the undesirable effect of overlapping, but also helps operators to detect faults and distinguish the causes of faults.
Additionally, the concerns of chip designers include not only the natural causes of faults but also the misbehavior of chips due to "planned" attacks, as, for example, in critical security applications.
The aim of the project is to support technicians that supervise the manufacturing plant to identify the causes of faults and failures on the machine and, in particular, to indicate a procedure for the recovery of its working condition.
This study aims to develop a framework for data mining and knowledge discovery from database that consists of a Kruskal Wallis test, K-means clustering, and the variance reduction splitting criterion to investigate the huge amount of semiconductor manufacturing data and infer possible causes of faults and manufacturing process variations.
