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The surface characteristics and modification mechanism of phosphorus slag particles were characterized by using Scanning Electronic Microscopy (SEM).
Surface morphology and roughness of pure Ti irradiated by a high-intensity pulsed ion beam (HIPIB) have been investigated by using scanning electronic microscopy and profilometry in order to explore the interaction mechanism between HIPIB and metallic materials.
Both RDE and EIS results indicated that the interfacial properties play the most important role on the electrocatalytic reaction where the surfaces of the modified electrodes were analyzed by using Scanning Electronic Microscopies (SEM).
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We first compared the morphologies and electronic properties of the five TM-TiO2 with TiO2 NPs by using scanning electron microscopy (SEM), Raman spectroscopy, and scanning transmission X-ray microscopy (STXM).
Hence, we finally compare the electronic properties and catalytic oxidation activities of the five TM-rGO samples with those of rGO by using scanning electron microscopy (SEM), Raman spectroscopy, EC measurements, and HRPES.
This increase can be explained by observations made using scanning electronic microscopy which revealed few yeasts attached to the monolayer and many bacteria attached to the yeast cell wall.
We used scanning electronic microscopy (SEM) to visualize potential adsorption of aggregates onto the cell surface.
Their unique electronic properties are characterized by using scanning tunneling microscopy/spectroscopy, photoluminescence, polarization dependent Raman spectroscopy and first principles calculations.
The lateral homogeneity of the electronic transport properties both in pristine and ion-irradiated graphene was investigated by local capacitance measurements on the graphene/SiO2/n+Si stack, using scanning capacitance spectroscopy (SCS) [12, 15].
Using scanning tunnelling microscopy, spectroscopy and wavefunction mapping, we confirm the predicted characteristic electronic structure of the Lieb lattice.
We started by characterizing the morphology of these composite materials using a scanning electronic microscope (SEM) and NanoSIMS microscopies.
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Justyna Jupowicz-Kozak
CEO of Professional Science Editing for Scientists @ prosciediting.com