Sentence examples for by using a field from inspiring English sources
All materials are characterized by using a field emission scanning electron microscope (SEM), an atomic force microscope (AFM), a Raman spectrometer, and a transmission electron microscope (TEM).
The structure of patterns and morphology of CNT forests were characterized by using a field emission scanning electron microscope (FE-SEM, JEOL JSM-5310).
The morphology and microstructure of samples were observed by using a field emission scanning electron microscopy (FESEM, JSM-6330F) and a transmission electron microscopy (TEM, Tecnai G2 Spirit).
We report the design of and results obtained by using a field programmable gate array (FPGA) to digitally process optical Doppler tomography signals.
For all of the CNTs, the changes in the surface morphologies due to thermal treatment and Al interlayer coating were monitored by using a field emission scanning electron microscope (FESEM; JSM-6330 F, JEOL, Tokyo, Japan).
Structural investigations of SiNW-based samples were carried out by using a field emission scanning electron microscope (Carl Zeiss ULTRA 55 FE-SEM, Oberkochen, Germany) and a transmission electron microscope (LEO 912 AB OMEGA, Oberkochen, Germany).
Furthermore, regarding only the best digital filters obtained, a finite precision and complexity analyses are carried out by using a field-programmable gate array device.
The surface morphologies of as-grown ZnO samples were investigated by using a field-emission scanning electron microscope (FE-SEM, FEI, Quanta FEG) and atomic force microscope (AFM, Asylum Research, Cypher).
Scanning electron microscopy (SEM) images of the samples are obtained by using a field-emission scanning electron microscope (JEOL JSM-7600F) operated at an acceleration voltage of 10 kV.
The morphology of composite films were characterized by using a field-emission scanning electron microscopy (FE-SEM, S-4800II, Hitachi, Japan) with the accelerating voltage of 5 15 kV.
The morphologies and structural properties were observed by using a field-emission scanning electron microscope (FE-SEM; LEO SUPRA 55, Carl Zeiss, Reutlingen, Germany) and a transmission electron microscope (TEM; JEM 200CX, JEOL, Tokyo, Japan).
