The Theta index value measures the sample structure by taking OTU abundance levels into consideration.
The sample structure was examined by means of transmission electron microscopy at a voltage of 100 kV.
The sample structure was examined by means of transmission electron microscopy at an accelerating voltage of 100 kV.
The sample structure was analysed by AFM with a Veeco Dimension 3100 instrument (Veeco Instruments Inc., Plainview, NY, USA) in the tapping mode.
The optimum laser power, scan speed, and slice distance between scanning processes were defined by testing the sample structures (see Figure S1, Supporting Information).
It suggests that the posterior distributions recovered when considering full sequence alignments are driven by the sequence information and are not mere by-products of the sampling structure in our dataset.
In this way, we can modulate the sample structures easily by adjusting the pH of the aqueous solution.
The sample structures were characterized by infrared spectroscopy.
The samples' structure was examined by X-ray diffraction, the XRD patterns being presented in Figure 2.
The samples structure was characterized by X-ray diffraction, revealing the mixed wurtzite and tetragonal structures of both ZnO cores and In2S3 shells, and the improvement in the structure with the increases of In2S3 shell thickness.
