Sentence examples for by scanning electronic microscope from inspiring English sources
The thickness and morphology of films were observed by scanning electronic microscope (SEM).
The microstructures and chemical compositions of the resultant microcapsules were investigated by scanning electronic microscope (SEM) and Fourier transformation infrared spectroscope (FT-IR).
The surface morphology and the structure of silica films were investigated by scanning electronic microscope (SEM) and Fourier transformed infrared spectroscopy (FTIR).
Porosity of the wicks is measured by Archimedes method and radius and distribution of pores is observed by Scanning Electronic Microscope (SEM), and permeability of wicks is calculated by empirical equation.
The fracture surface morphology was revealed by scanning electronic microscope (SEM), which showed that the fracture structure varied with both the addition of EBR28 in TPO plaques and the annealing condition.
The morphological observation by scanning electronic microscope (SEM) indicated that PC phase in situ generated more and finer microfibrils in the dynamic samples than in the static ones, and the CNTs predominantly localized in the PC microfibrils without obvious migration to PE matrix and also aligned along the microfibrils.
The prepared BiOI and BiOI-based photoanodes were characterized by X-ray diffraction (XRD), scanning electronic microscope (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), and UV vis diffuse reflectance spectroscopy (DRS) to examine the surface structure and the properties of light absorption.
Microstructure of the coatings was examined by optical microscope (OM), scanning electronic microscope (SEM), energy dispersive spectroscopy (EDS) and X-ray diffractometer (XRD).
Single crystalline Si grains with an average size of 10 μm were obtained and further characterized by an optical microscope, scanning electronic microscope (SEM) and Raman spectrometer.
The surface morphology and structure of silica films were investigated by atomic force microscopy, scanning electronic microscope, Fourier transformed infrared spectroscopy, and X-ray photoelectron spectroscopy.
