Sentence examples for by performing scanning electron from inspiring English sources
The lethal effect of nanoparticles on the surface of bacteria was imaged by performing scanning electron microscopy of the CuNPs, ZnONPs, and antibiotic to treated test strain.
The dependence of thermo-physical properties and machining variables on mechanism of MRR and Ra has been described by performing scanning electron microscope (SEM) study.
The nitrided layers were characterized by performing scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction (XRD), and a Vickers microhardness test.
Thereafter, we explored the in-vitro cellular responses of hASCs to SIM-BioCaP by performing scanning electron microscopy observation, proliferation assay, alkaline phosphatase (ALP) activity assay, alizarin red staining and real-time PCR.
Wagner & Seitz [ 7, 8] have published supplementary information to morphological observations by performing scanning electron microscopy (SEM) on adult worms.
We examined the leaf primordia initiation by performing scanning electron microscopy (SEM) on jba-1D/+er-20 seedlings and found that the four primordia emerge simultaneously at the SAM periphery (Fig. 1G), suggesting the concurrent establishment of auxin maxima at four distinct locations around the SAM (Fig. 1N).
Qualitative analysis of the microstructure of heated and unheated mortar was performed by Scanning Electron Microscope (SEM) while quantitative analysis was performed on SEM images using Image Pro-plus software.
Direct extraframework porosity visualization inside a zeolite crystal was performed by scanning electron microscopy (SEM) assisted by focus ion-beam (FIB) milling; this approach is particularly suited for detailed structural characterization of catalyst particles not transparent to the electron beam.
Morphological analyses were performed by scanning electron microscopy (SEM), and thermal analyses by thermogravimetry (TGA) and differential scanning calorimetry (DSC).
Topographic analysis was performed by scanning electron microscopy (SEM) and surface roughness measurement by Atomic Force Microscopy (AFM).
Profound characterization was performed by scanning electron microscope (SEM) Tescan Mira 3 LMU with a 20-nm electronic beam diameter during the measurements.
