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Identification of the phases was achieved by comparing the diffraction patterns of the samples with ICDD standards.
By comparing the diffraction pattern with the BF image, we find that the nanowire is grown along [111] of the ZB structure which is equivalent with [0001] in the WZ structure.
Identification was done by comparing the diffraction patterns with the standard X-ray diffraction pattern of the synthesized cobalt oxide that was analyzed to investigate the phase structure and the crystallinity which is shown in Figure?3.
That calculation requires measuring the x-rays' intensity and determining their phase, the relative timing--a harder problem traditionally solved by comparing the diffraction pattern from a pure crystal with one from a similar crystal in which heavy metal atoms substitute for some components of the crystal.
The suppression of the dynamical effects can be understood by comparing the diffraction from a perfect (Figs. 4 ▸ a, 5 ▸ c) and an imperfect (Figs. 4 ▸ b, 5 ▸ d) crystal.
Therefore, the SNR in any given frequency range is readily estimated by comparing the diffraction peak to the surrounding region, and the resolution is determined by the spatial frequency of the highest resolution diffraction peaks clearly detectable (typically 3× higher) over background noise.
Similar(54)
By carefully comparing the diffraction peaks in curves 1 and 2, it can be found that the intensities of two peaks at 2θ = 28.3° and 43.9° (corresponding to the (101) and (110) faces of CdS, respectively) in the ITO/nc-TiO2/CdS 10) fITO/nc-TiO2/CdS 10an the intensities ofilmose in the plare ITO/nc-TiO2 film, indicatingreaterormathan of the hexagonal-phase CdS.
The phase identification was achieved by comparing the sample diffraction pattern with standard cards in ICDD-JCPDS database.
The crystallinity of the pyrolyzed carbon was analyzed by comparing the HRTEM diffraction patterns of a suspended nanowire and the Raman spectroscopy results of bulk carbon structures.
Maps of high quality and reliability were obtained by comparing the recorded diffraction patterns with pre-calculated templates.
By comparing the four XRD patterns, the diffraction peaks of CHA nanorods are a bit broader than the corresponding peaks of HA nanorod, indicating crystal lattice change induced by substitution of carbonate ions.
More suggestions(15)
by simulating the diffraction
by recording the diffraction
by comparing the content
by calculating the diffraction
by comparing the spending
by monitoring the diffraction
by comparing the radiocarbon
by circumventing the diffraction
by comparing the judgment
by fitting the diffraction
by comparing the treatment
by displacing the diffraction
by comparing the coefficient
by employing the diffraction
by altering the diffraction
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