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The film thickness was measured by a surface profile-meter (Dektak 8).
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The films thickness was measured after deposition process with a Surface Profile Meter, Bruker Dektak XT profilometer.
(a) Surface profile.
First, a surface profile was obtained.
At key locations, we measured vertical separation by taking surface profile using a laser distance meter (Laser Technology TruPulse 200X) and a target prism that gives a measurement accuracy of ±4 cm.
The surface roughness and morphology was measured and characterized by a profile meter and a scanning electron microscopy, respectively.
In this paper, the analysis of surface roughness at the crest of the thread in high speed thread milling using a high accuracy optical profile-meter is an original contribution to the literature.
A linear surface profile represented by the white arrow is shown in Fig. 3b.
From each normal vector and its coordinates, the surface profile is obtained by a surface reconstruction algorithm.
(a) Change to surface profile by mechanical processing.
The experimental roughness was obtained by measuring the surface roughness of the milled surfaces with a non-contact profile meter.
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