Conductivity measurements of TiO2 films were measured by using a source meter (Keithley 2400).
Current density-voltage (J-V) curves of the devices were performed by using a source meter (Keithley 2440) and under standard illumination (AM 1.5 G, 100 mW cm−2) from a Newport Oriel Solar Simulator.
The vacuum gauge output was measured by using a source meter (Keithley 2400, Cleveland, OH, USA) and LabVIEW software (National Instruments Corp., Austin, TX, USA). Figure 1 Structure of MWCNT device and FE-SEM image of MWCNT paste after heat treatment.
The device current-voltage curves and PCE were obtained by Labview software and a source meter (National Instruments, model NI PXI-1033, TX, USA).
The current density-voltage curves and PCE of solar cell devices were obtained by a solar simulator and a source meter (National Instruments, model NI PXI-1033, TX, USA) under AM1.5G solar irradiation with intensity of 1000 W/m2.
The current density-voltage characteristics of photocurrent density-photovoltage were simulated at AM 1.5G illumination (100 mV cm−2, XES-301S, SAN EI, Osaka, Japan) and recorded by a Keithley source meter (Keithley, Cleveland, OH, USA).
The current-voltage (I-V) and endurance characteristics of the device were measured by a Keithley 2635 source meter (Keithley Instruments, Inc., Cleveland, OH, USA) and a probe station at room temperature in a voltage sweep mode.
