Sentence examples for both the model parameters from inspiring English sources
From each prototype we created a set of 110 150 genes sampled across different time series (Fig. 2a), for each such gene both the model parameters and its cluster (according to the original prototype) are known.
In addition, the PM_CMPS methodology also yields reduced uncertainties for both the model parameters and responses.
The analysis of experimental data was carried out with the Bayesian techniques described in the methods section and in the supplementary text, and we estimated both the model parameters, and the Bayes factors for model selection23.
Therefore, a method that can simultaneously estimate both, the model parameters and the background rate, becomes desirable.
This indicates that no significant non-identifiability exists and thus simultaneous estimation of both the model parameters and the background rate function (mu (t)) is feasible.
AIC = nleft[ {ln left( {frac{text{RSS}}{text{n}}} right)} right] + 2k (1)where n is the number of data points (i.e. sample size), RSS is the residual sum of squares, and k is the total number of estimated model parameters, which include both the model parameters and the constant.
In both cases, the model parameters are estimated by maximising the Gaussian log-likelihood function of the observed data, which can be readily obtained either as a by-product of the Kalman filter prediction equations or from Whittle's (1962) frequency domain asymptotic approximation.
By means of triangular contour plots, correlations in the time evolution of isograms of both the model parameter and carbonation depth of fly ash slag cement materials were analyzed.
By fitting a single model to all individuals simultaneously, whilst allowing for two levels of random effects (noise), estimates can be made of both the model parameter typical values and their inter-individual variability, in addition to the residual variability.
Both uncertainties in the model parameters and bounded external perturbations are considered.
This paper presents both methodologies to generate the model parameters required for the implementation of accurate component fault models and simulation results from representative defective structures in a MEMS product.
