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Currently, both scanning electron microscope (SEM) and transmission electron microscope (TEM) have been used in liquid-phase electron-beam-induced deposition (LP-EBID) research.
The MWNT-NH2 attached covalently to PMMA was confirmed by both scanning electron microscope and transmission electron microscope.
The image of a PADAP film is constructed of spherical particles with an average diameter of 50 nm, which was examined by both scanning electron microscope (SEM) and atomic force microscopy (AFM).
Figure 1 shows both scanning electron microscope (SEM) and atomic force microscope (AFM) images of the Ni mold used.
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Both atomic force microscope (AFM) and scanning electron microscope (SEM) measurements results show that the lapping quality of diamond cutting tools is much improved with the proposed lapping approach.
Polytetrafluoroethylene. Scanning electron microscope.
Field effect scanning electron microscope.
Scanning electron microscope (SEM) images were recorded on a HITACHI S-570 scanning electron microscope.
Scanning electron microscope (SEM) images were obtained by a scanning electron microscope (JEOL, JSM-5610LV).
The gradient structure was investigated by scanning electron microscope (SEM).
Microstructure of produced composite was investigated by scanning electron microscope.
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Justyna Jupowicz-Kozak
CEO of Professional Science Editing for Scientists @ prosciediting.com