Bonds are characterized using a micro-tester for mechanical strength and ductility.
The surface finish, which plays an important role in bonding, was characterized using a surface profiler and the OnduloMD system.
The cured bond lines were characterized using nanoindentation and optical microscopy.
The changes in the surface chemical bonding and surface composition were characterized using a Fourier transform infrared spectroscopy (FTIR) instrument (PerkinElmer Spectroscopy GX, Branford, CT, USA).
The chemical compositions and bonding states in the films were characterized using X-ray photoelectron spectrometry (XPS) with Al Kα (1486.6 eV) radiation; pre-sputtering was performed for 10 s to remove any contamination from the surface.
The detailed morphologies and chemical bonding states of the samples were characterized using a JOEL JEM 2100 transmission electron microscope (TEM; Tokyo, Japan) and Renishaw micro-Raman 2000 system (Wotton-under-Edge, UK) and a 514-nm laser line excitation.
The chemical structure, crystallinity, and intermolecular bond stretching of the copolymer membranes were characterized using 1H-NMR, XRD, and FT-IR instrumentations.
The chemical compositions and chemical bond states of the thin films were characterized using X-ray photoelectron spectroscopy (XPS).
End effects in unperturbed chains with a specified number of bonds, n, have previously been characterized using the conformations at individual bonds and the mean square unperturbed dimensions of subchains situated at various positions along the chain.
The crystal structures, chemical composition, surface morphologies, chemical bonding states of the film was characterized using X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and field emission scanning electron microscope (FE-SEM) measurements.
