Exact(51)
Positive bias temperature stress.
Negative bias temperature illumination stress.
The analyzing condition to evaluate the TFT's stability under negative gate bias temperature illumination stress (NBTIS) was as follows.
Accurate parameters of negative bias temperature instability (NBTI) model are essential to predict the circuit lifetime during circuit design.
Negative bias temperature instability (NBTI) is a serious reliability concern for both analog and digital CMOS VLSI circuits.
Impact of hot carrier effect and negative bias temperature instability on the VCO's phase noise is discussed.
Similar(9)
Hardness testing gave values between 450 and 1968 kg/mm2, with higher bias, temperatures and N2 gas concentrations promoting higher hardness levels.
Furthermore, thermal diodes present a well-defined breakdown as well as forward bias temperatures given by the endothermic transition temperature during forward and reverse bias mode respectively which control accurately the on state of the device.
We utilize REST tool to develop a new dynamic reliability management (DRM) scheme to address time-dependent dielectric breakdown and negative-bias temperature instability aging mechanisms in network-on-chip (NoC) based CMPs.
The data retention time is measured as a function of biasing, temperature and device dimensions, leading to a simple predictive model.
It is also shown that probe-volume heterogeneity biases temperature measurements made with two-color pyrometry toward the higher temperatures in the probe volume.
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