Moreover, leaf and flag leaf area indices and crop growth rate were monitored at flowering and maturity, respectively.
DNA methylation pattern of fragments 6.8 k(a) and 7.6 k was analyzed on fourth leaf and flag leaf samples.
In our investigation, even in leaf and flag leaf, TalnRNA9 was differentially expressed, which suggested that long npcRNAs probably had much more precise expression regulation mechanisms.
Higher phenotypic variation was observed for panicles per plant, grain yield per plant, per cent sterility, spikelets per panicle, filled grains per panicle, spikelet setting density, flag leaf length and flag leaf width.
No significant difference was observed between the 4th leaf and the flag leaf samples, thus revealing that the DNA methylation profile observed is maintained through mitosis.
Likewise, the population averages of flag leaf length (FLL) and flag leaf width (FLW) were only slightly reduced.
In this second experiment, DNA and RNA were extracted from the 4th leaf and the flag leaf in parental plants and from the 4th leaf in the progeny.
Yan and Wang (1990) studied 11 flag leaf traits in indica-japonica hybrids, and argued that flag leaf length (FLL), FLW and flag leaf area (FLA) were controlled by two pairs of genes with at least more than 60% heritability.
Comparison of the three transcript sets as visualised in Figure 1 revealed high similarity between flag leaf and grain contigs (34.8% of identical sequences).
The flag leaf length (FLL, cm) and flag leaf width (FLW, cm) were measured on three tillers.
