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Structure and morphology of thin films have been studied by atomic force microscopy (AFM) and X-ray diffraction (XRD).
In addition, surface topography and crack development have been studied by atomic force microscopy (AFM) and microindentation.
The surface morphology of both types has been studied by atomic force microscopy (AFM) and scanning electron microscopy (SEM).
The nano-mechanical properties and the local adhesion force have been studied by atomic force acoustic microscopy and force-distance spectroscopy.
Wear of fluorinated carbon films deposited by plasma assisted chemical vapor deposition has been studied by atomic force microscopy and the sliding sphere test.
The surface topography of wear scar has been studied by atomic force microscopy and scanning electron microscopy.
Similar(54)
Surface roughness was studied by Atomic Force Microscopy (AFM).
The film morphology was studied by atomic force microscopy.
The transfer film was studied by atomic force microscopy (AFM) and scanning electron microscopy (SEM).
Surface morphology and particle size of the films were studied by atomic force microscopy.
The morphology of the electro-devices was studied by atomic force microscopy showing good nanocrystal dispersion.
More suggestions(15)
been demonstrated by atomic
been defined by atomic
been hit by atomic
been studied by dynamic
been studied by many
been characterized by atomic
been handled by atomic
been confirmed by atomic
been studied by Western
been prepared by atomic
been probed by atomic
been fabricated by atomic
been encapsulated by atomic
been observed by atomic
been deposited by atomic
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