The surface activity properties of all the surfactants have been characterized using surface tension and electrical conductivity measurements.
The binding and dissociation of CXCL12 and CXCR4 has been characterized using surface plasmon resonance, giving kon=4.20×10 M s, koff=8.24×10−3 s, and K D =3.47×10−8 M, showing that the reactions equilibrate with a characteristic time of about 44 seconds for CXCL12 concentration equal to the reactions' K d (35 nM) (Vega et al. 2011).
The carbon cryogels were characterized using surface area analyzer and NH3-TPD.
The samples were characterized using surface area measurement, XRD, FT-IR, and UV vis DRS techniques.
A model tear film lipid layer composed of a binary mixture of cholesteryl myristate (CM) and 1,2-dipalmitoyl sn-glycero-3-phosphocholine (DPPC) was characterized using surface tension measurements, Brewster angle microscopy (BAM) and interfacial stress rheology (ISR).
The catalysts were characterized using surface area analysis (BET), X-ray diffraction (XRD), and transmission electron microscopy (TEM).
The roughness, surface free energy and wettability of the surfaces were characterized using surface roughness meter inception, dynamic contact angle meter (tensiometer).
Worn coating surfaces and pin scars were characterized using surface profilometer, scanning electron microscopy/energy dispersive spectroscopy (SEM/EDS), focus ion beam, Raman spectroscopy and scanning transmission electron microscopy (STEM).
The surface properties, surface morphology, and surface chemistry of the plasma coated stents were characterized using surface contact angle measurements, scanning electron microscopy (SEM), and energy dispersive spectrometer (EDS).
The surface oxide layers formed with MAO and chemical treatments on Zr disks were characterized using surface analyses; the calcium phosphate formation on the specimens after immersion in Hanks' solution was evaluated.
The plasma-polymerized thin films made by the different methods were characterized using surface analytical instruments: field-emission scanning electron microscope (FE-SEM), atomic force microscope (AFM), X-ray photoelectron spectroscopy (XPS), near-edge X-ray absorption fine structure (NEXAFS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS).
