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The defect structures of three different orientation ([001], [011] and [111]) shocked single crystals of tantalum have been characterised using scanning electron microscopy and transmission electron microscopy.
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Such changes were characterised using scanning electron microscopy (SEM).
The cross-linked microcapsules were characterised using scanning electron microscopy, FT-IR spectroscopy and thermogravimetric analysis.
Scaffold topography was characterised using scanning electron microscopy and microcomputed tomography.
The deposited films were characterised using scanning electron microscopy, X-ray diffraction and Raman spectroscopy.
Samples were characterised using scanning electron microscopy (SEM) and electrochemical impedance spectroscopy (EIS).
The grown nano-structures were characterised using scanning electron microscopy (SEM), Ultra Violet Visible spectroscopy (UV-Vis) and Raman spectroscopy.
The coatings were characterised using scanning electron microscopy and X-ray diffraction.
The results were characterised using scanning electron microscopy (SEM), transmission electron microscopy (TEM) and X-ray photoelectron spectroscopy (XPS).
The deposited films were characterised using scanning electron microscope, X-ray diffRamanon, Raman spectroscopy and UV/Vis spectroscopy.
The microstructures of the coatings were characterised using scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS).
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