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All material properties are arbitrary functions along the beam thickness.
For a fixed beam thickness, a maximum sensitivity exists for appropriate PZT/Si thickness ratio.
The T-beam microstructure is fabricated on silicon-on-insulator (SOI) wafers for uniform beam thickness.
The total beam thickness is kept constant and its maximal deflection under its own weight is limited to its thickness.
The flow stress scales approximately inversely with the beam thickness t.
It is assumed that material properties follow exponential distributions through beam thickness.
Material properties vary continuously through the beam thickness according to the power-law form.
Material properties are assumed to vary continuously in the beam thickness direction according to a power law distribution.
It is assumed that the material properties vary along the beam thickness only according to exponential distributions.
The magnetoelastic model, whose beam thickness and the deflection are very small compared with the length, is taken for analysis.
As an initial step towards this, a previous study mathematically predicted the effect of ultrasound beam thickness on contact area measurements at a two-body interface.
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