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Localization of the beam on the sample was 200 nm.
Localization of a beam on the sample was 200 nm.
The divergence slit was set to a constant footprint size of 12 mm of the beam on the sample.
In XRD, a scattered intensity of X-ray beam on the sample provides information about the studied material such as chemical composition, crystallographic structure, and physical properties.
Note that the slopes determined here depend on the incident angle of the beam on the sample, which is determined by the Cassegrain mirror.
During analysis the power delivered by the laser beam on the sample surface was adjusted in the range of 0.5 50 mW.
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The laser power was kept below 1.0 mW on the sample to avoid laser-induced local heating, while an Olympus MPLN100x objective (NA = 0.90) was used to focus the beam on the samples.
The galvo scanner in the LSM was used to scan the collinear pumping and Stokes beams on the sample.
This way, on one hand a variation of the diameter of the X-ray generating electron beam allows to vary the X-ray beam diameter on the sample surface.
An axicon lens creates a Bessel intensity distribution that is relayed on the beam steering device and further in the objective back-focal plane to produce a Bessel beam illumination on the sample.
The method uses two different focusing optics, one upstream of the sample to generate the microfocused X-ray beam incident on the sample (as with all other applications addressed herein) and another placed between the sample and the detector to restrict the X-ray light accepted by the detector to a narrow volume where the two foci intersect.
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Justyna Jupowicz-Kozak
CEO of Professional Science Editing for Scientists @ prosciediting.com