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A dual ion/electron beam microscope was used to analyse subsurface indentation damage.
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A Zeiss cross beam electron microscope was used to study fibrin fibres.
To get a closer look on the surface of the calendered electrodes, Carl Zeiss Auriga-BU focused ion beam field emission scanning electron microscope was used for observations.
A Gaussian beam (wavelength 632 nm) from a scanning confocal transmission microscope was used to illuminate the slit.
A focused ion beam and a scanning electron microscope were used to reveal the influence of those stresses on the location of the cracks' initiation and the mechanism of the small-crack propagation.
On the contrary, the here shown scattering microscope is using an unidirectional illumination beam.
An HFT UV/488/543/633 beam splitter was used.
After the laser unit, a beam expander was used to collimate the beam and extend the beam in order to slightly overfill the back aperture of the microscope objective.
External beam radiation was used for radiotherapy.
A UV/488/543/633 main beam splitter was used.
This was then placed inside the microscope, and after ion milling to expose the required region, an imaging electron beam of 1.6 kV was used with a milling beam of 30 kV and 800 pA.
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