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A roadmap based on simulated diffraction patterns along several low index zone axes parallel to planar defects is constructed to facilitate the practical TEM examination.
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All simulations were based on simulated sibling pairs only, and the simulated marker was assumed to be the actual QTL.
This paper presents an optimization algorithm based on Simulated Annealing.
The proposed algorithm is based on Simulated-Annealing (SA).
Based on the simulated XRD-PF diffraction peaks, the long needle axis (LNA) and long molecular axis (LMA) orientations of B orientated fibers have been deduced and are presented in Figure 4 by solid filled arrows.
The insets are the diffraction patterns based on fast Fourier transform (FFT).
The simulated diffractions based on these calculations qualitatively agreed with the experimental observations.
Instead of reconstructing the crystal structure by inverting the diffraction data, virtual diffraction experiments are performed on the finite element mesh and the resulting simulated diffraction patterns are compared directly to the experimental results.
The study was based on a simulated outbreak; therefore, the participants' reactions were to a simulated, not an actual, crisis.
In our simulation results, the "correct" solution was in fact identified based on the simulated data.
The approach proposed is based on a simulated annealing framework.
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